Effective number of bits

Results: 25



#Item
11Digital signal processing / Electronic circuits / Analog-to-digital converter / Operational amplifier / Amplifier / Sampling / Digital-to-analog converter / Effective number of bits / Power supply rejection ratio / Electronics / Electronic engineering / Electromagnetism

AD781–SPECIFICATIONS DC SPECIFICATIONS (TMIN to TMAX, VCC = +12 V 6 10%, VEE = –12 V 6 10%, CL = 20 pF, unless otherwise noted) Parameter

Add to Reading List

Source URL: www.analog.com

Language: English - Date: 2010-09-08 12:09:51
12Electromagnetism / Noise / Digital audio / Measurement / Delta-sigma modulation / Signal-to-noise ratio / Analog-to-digital converter / Quantization error / Effective number of bits / Digital signal processing / Electronics / Signal processing

Microsoft Word - IO_TechNote_083109.doc

Add to Reading List

Source URL: www.ieee.li

Language: English - Date: 2009-11-11 22:58:21
13Electromagnetism / Analog-to-digital converter / Spurious-free dynamic range / Delta-sigma modulation / Sampling / SINAD / Effective number of bits / Digital-to-analog converter / Signal-to-noise ratio / Digital signal processing / Electronics / Signal processing

Microsoft Word - imeko07_MS_1c.doc

Add to Reading List

Source URL: eprints.maynoothuniversity.ie

Language: English - Date: 2013-10-10 05:53:42
14Electronic circuits / Electromagnetism / Measurement / Noise / Analog-to-digital converter / Effective number of bits / Analog Devices / Differential amplifier / Comparator / Digital signal processing / Electronics / Electronic engineering

ADC Driver Selection Guide

Add to Reading List

Source URL: www.analog.com

Language: English - Date: 2012-09-21 12:36:32
15Electrical engineering / Analog-to-digital converter / Effective number of bits / Quantization error / Spurious-free dynamic range / Delta-sigma modulation / Digital-to-analog converter / SINAD / Sampling / Digital signal processing / Electronics / Electromagnetism

TC[removed]Minutes page 1 of[removed]:23 PM

Add to Reading List

Source URL: grouper.ieee.org

Language: English - Date: 2007-05-16 17:24:55
16Noise / Engineering / Digital signal processing / Effective number of bits / Measurement

IEEE-STD-1658 DAC STANDARDS WORKING COMMITTEE Norwood, MA 03 June 2009, 09:00 – 17:00 Attendees: Steve Tilden, LTX-Credence, Chair and Host (by Webex) Sol Max, LTX-Credence Corporation, Secretary

Add to Reading List

Source URL: grouper.ieee.org

Language: English - Date: 2009-07-07 15:05:07
17Electrical engineering / Digital-to-analog converter / Effective number of bits / Total harmonic distortion / Distortion / Audio power / SINAD / Sampling / Electronics / Electromagnetism / Digital signal processing

IEEE-STD-1658 DAC STANDARDS WORKING COMMITTEE Webex 15 December 2009, 11:00 – 16:00 17 December 2009, 11:00 – 16:00 Attendees: (via Webex) Steve Tilden

Add to Reading List

Source URL: grouper.ieee.org

Language: English - Date: 2009-12-22 22:03:17
18Electromagnetism / Noise / SINAD / Effective number of bits / Analog-to-digital converter / Signal-to-noise ratio / Power supply rejection ratio / Electronics / Measurement / Digital signal processing

TC[removed]Minutes page 1 of[removed]:50 PM

Add to Reading List

Source URL: grouper.ieee.org

Language: English - Date: 2007-11-05 21:51:57
19Electronic engineering / Digital-to-analog converter / Analog-to-digital converter / Sampling / Spurious-free dynamic range / Differential nonlinearity / Quantization error / Effective number of bits / Signal-to-noise ratio / Digital signal processing / Electronics / Electromagnetism

P1658 Digital to Analog Standard Meeting, February 21, 2008 Attendees: Steve Tilden, Texas Instruments (Chair) [removed] Robert Graham, Sandia National Labs., Albuquerque, NM USA [removed]

Add to Reading List

Source URL: grouper.ieee.org

Language: English - Date: 2008-03-03 15:23:27
20Technology / Digital-to-analog converter / Spurious-free dynamic range / Signal generator / Differential nonlinearity / Effective number of bits / Integral nonlinearity / Digital signal processing / Electronics / Electromagnetism

Minutes of March 17, 2004 TC-10 Meeting in Boulder, Colorado Draft Standard for Terminology and Test Methods for Digital to Analog Converters Attendance: Steve Tilden Tom Linnenbrink Bill Boyer

Add to Reading List

Source URL: grouper.ieee.org

Language: English - Date: 2004-04-27 12:19:28
UPDATE